Product Brands

High Resolution 3D Surface Non-Contact Measurement Systems

Preciese 3D Scanners in Harsh Environment with up to 0.013mm accuracy

Scanning Acoustic Microscopy Analytical Systems

Wafer Inspection Systems

Reflow Simulator for Observation and Measurement

Desktop Scanning Electron Microscopes and EDS Systems

Real Time X-Ray and CT Inspection System

Electron Microscope Supplies

Full solution of Metallography, Metallurgical Testing, Microstructural Analysis

  • Brand
  • Nikon Metrology

XT V 130C

Cost-effective X-ray inspection of electronic components

  • Brand
  • Nikon Metrology

XT V 160

XT V 160 high-quality Xray inspection system

  • Brand
  • Nikon Metrology

XT H 225

XT H 225 for all-purpose X-ray and CT inspection