lorem ipsum dolor sit thumb

cyberTECHNOLOGIES for Semiconductor Application

Application: Semiconductor & Electronics

High-resolution, non-contact 3D measurement system options to the microelectronics

Send Inquiry




Surface of a silicone wafer

  • Accurate flatness measurement over large areas
  • Colors can be set to specification limits


Surface image of a Micro BGA

  • Measure max. height, diameter and position of each bump
  • Regression and seating plane coplanarity



Countour map of an electronic component

  • Advanced etch removing and modifiying algorithms
  • Use polygon shape cursors to mark region of interest