Product Brands

High Resolution 3D Surface Non-Contact Measurement Systems

The Fastest Power Discrete Semiconductor Testers in the World

Scanning Acoustic Microscopy Analytical Systems

Full solution of Metallography, Metallurgical Testing, Microstructural Analysis

Electron Microscope Supplies

Wafer Inspection Systems

Nikon XTV160 Xray

Reflow Simulator for Observation and Measurement

Preciese 3D Scanners in Harsh Environment with up to 0.013mm accuracy

Captura Easy-to-use and cost-effective optical coordinate measuring machine (CMM)

Desktop Scanning Electron Microscopes and EDS Systems

  • Brand
  • cyberTECHNOLOGIES

CT 300

Non-contact profilometer with a 315 x 315 XY scanning area


  • Brand
  • PVA TePla SAM

SAM 301 HD2

Most popular customer choice for high performance failure analysis in both production and R&D environments


  • Brand
  • PVA TePla SAM

SAM 302 TWIN

SAM system that utilizes arrays of two transducers to acquire simultaneous acoustic images


  • Brand
  • Hexagon

Captura

Easy-to-use and cost-effective optical coordinate measuring machine (CMM)


  • Brand
  • Thermo Fisher Scientific

Phenom Pro X

Best Selling Table Top SEM with EDX


  • Brand
  • Thermo Fisher Scientific

Phenom Pharos SEM with FEG

This is the first desktop SEM solution from Thermo Fisher Scientific with resolutions below 3 nm and a field emission gun (FEG)


  • Brand
  • cyberTECHNOLOGIES

CT 350

Non-contact profilometer with a 350 x 350 XY scanning area


  • Brand
  • ipTEST

Mostrak 2

The Fastest Power Discrete Semiconductor Testers in the World


  • Brand
  • Nikon Xray

XT V 160

XT V 160 high-quality Xray inspection system


  • Brand
  • cyberTECHNOLOGIES

CT 100

Compact, high resolution non-contact profilometer up to 150 x 150mm scanning area


  • Brand
  • Cores

Microview core9046a

Microview core9046a : Heating observation & measurement system


  • Brand
  • PVA TePla SPA

SPA Inker

Fast Physical Inking of Wafers with 100% Ink Dot Quality Control


  • Brand
  • PVA TePla SPA

Semi Automatic Wafer Inspection

Wafer Inspection System with Wafer Loader and Wafer Mapping Software


  • Brand
  • PVA TePla SPA

SPA Inspector IR Wafer Inspection

AOI of Wafer Surfaces and Layers in 2D with IR Technology


  • Brand
  • Thermo Fisher Scientific

Phenom XL

Large Sample Size (100 x 100mm) Desktop SEM