High Resolution 3D Surface Non-Contact Measurement Systems
The Fastest Power Discrete Semiconductor Testers in the World
Reliable High Speed Test Handlers since 2011
High End 3D CT X-Ray
Scanning Acoustic Microscopy Analytical Systems
Full solution of Metallography, Metallurgical Testing, Microstructural Analysis
Electron Microscope Supplies
Wafer Inspection Systems
Nikon XTV160 Xray
Reflow Simulator for Observation and Measurement
eviXscan 3D is a brand of high quality scanners based on structured light technology
Captura Easy-to-use and cost-effective optical coordinate measuring machine (CMM)
Compact, high resolution non-contact profilometer up to 150 x 150mm scanning area
The CT 350S is a non-contact profilometer with a 350 mm x-, y-scanning stage
The CT 600S is a non-contact profilometer with a 600 mm x-, y-motion system