Product Brands

High Resolution 3D Surface Non-Contact Measurement Systems

Preciese 3D Scanners in Harsh Environment with up to 0.013mm accuracy

Scanning Acoustic Microscopy Analytical Systems

Wafer Inspection Systems

Reflow Simulator for Observation and Measurement

Desktop Scanning Electron Microscopes and EDS Systems

Captura Easy-to-use and cost-effective optical coordinate measuring machine (CMM)

Power Semiconductor Testers

Electron Microscope Supplies

Full solution of Metallography, Metallurgical Testing, Microstructural Analysis

  • Brand
  • Micro to Nano

SEM Sample Holders

SEM Sample Holders


  • Brand
  • Micro to Nano

Sample Preparation

Sample Preparation for EM


  • Brand
  • Micro to Nano

Filaments and Cathodes

Electron Microscope Filaments & Cathodes


  • Brand
  • Micro to Nano

FIB Supplies

FIB Supplies


  • Brand
  • Micro to Nano

Calibration Standards and Samples

Calibration Standards and Samples


  • Brand
  • Micro to Nano

Adapters for Stubs and Stages

Adapters for Stubs and Stages


  • Brand
  • Micro to Nano

SEM Sample Stubs

SEM Sample Stubs