Product Brands

High Resolution 3D Surface Non-Contact Measurement Systems

The Fastest Power Discrete Semiconductor Testers in the World

Scanning Acoustic Microscopy Analytical Systems

Full solution of Metallography, Metallurgical Testing, Microstructural Analysis

Electron Microscope Supplies

Wafer Inspection Systems

Nikon XTV160 Xray

Reflow Simulator for Observation and Measurement

Preciese 3D Scanners in Harsh Environment with up to 0.013mm accuracy

Captura Easy-to-use and cost-effective optical coordinate measuring machine (CMM)

  • Brand
  • Micro to Nano

SEM Sample Holders

SEM Sample Holders


  • Brand
  • Micro to Nano

Sample Preparation

Sample Preparation for EM


  • Brand
  • Micro to Nano

Filaments and Cathodes

Electron Microscope Filaments & Cathodes


  • Brand
  • Micro to Nano

FIB Supplies

FIB Supplies


  • Brand
  • Micro to Nano

Calibration Standards and Samples

Calibration Standards and Samples


  • Brand
  • Micro to Nano

Adapters for Stubs and Stages

Adapters for Stubs and Stages


  • Brand
  • Micro to Nano

SEM Sample Stubs

SEM Sample Stubs