Product Brands

High Resolution 3D Surface Non-Contact Measurement Systems

Preciese 3D Scanners in Harsh Environment with up to 0.013mm accuracy

Scanning Acoustic Microscopy Analytical Systems

Wafer Inspection Systems

Reflow Simulator for Observation and Measurement

Desktop Scanning Electron Microscopes and EDS Systems

Real Time X-Ray and CT Inspection System

Electron Microscope Supplies

Full solution of Metallography, Metallurgical Testing, Microstructural Analysis

  • Brand
  • PVA TePla SAM

SAM 301 HD2

Most popular customer choice for high performance failure analysis in both production and R&D environments

  • Brand
  • PVA TePla SAM


SAM system that utilizes arrays of two transducers to acquire simultaneous acoustic images

  • Brand
  • PVA TePla SAM

SAM Auto Tray

Production Auto Tray SAM System with Tray Loader for In-Line SAM