High Resolution 3D Surface Non-Contact Measurement Systems
The Fastest Power Discrete Semiconductor Testers in the World
Reliable High Speed Test Handlers since 2011
High End 3D CT X-Ray
Scanning Acoustic Microscopy Analytical Systems
Full solution of Metallography, Metallurgical Testing, Microstructural Analysis
Electron Microscope Supplies
Wafer Inspection Systems
Nikon XTV160 Xray
Reflow Simulator for Observation and Measurement
eviXscan 3D is a brand of high quality scanners based on structured light technology
Captura Easy-to-use and cost-effective optical coordinate measuring machine (CMM)
High resolution 3D X-ray CT system Versatile MicroFocus model, perfect for inspection & analysis of SMT boards or other items.
3D X-ray CT system High-end Nano-focus model, ideal for inspection & analysis of semiconductors & electronic components.