Product Brands

High Resolution 3D Surface Non-Contact Measurement Systems

The Fastest Power Discrete Semiconductor Testers in the World

Scanning Acoustic Microscopy Analytical Systems

Full solution of Metallography, Metallurgical Testing, Microstructural Analysis

Electron Microscope Supplies

Wafer Inspection Systems

Nikon XTV160 Xray

Reflow Simulator for Observation and Measurement

Preciese 3D Scanners in Harsh Environment with up to 0.013mm accuracy

Captura Easy-to-use and cost-effective optical coordinate measuring machine (CMM)

Desktop Scanning Electron Microscopes and EDS Systems

  • Brand
  • PVA TePla SPA

SPA Inker

Fast Physical Inking of Wafers with 100% Ink Dot Quality Control


  • Brand
  • PVA TePla SPA

Semi Automatic Wafer Inspection

Wafer Inspection System with Wafer Loader and Wafer Mapping Software


  • Brand
  • PVA TePla SPA

SPA Inspector IR Wafer Inspection

AOI of Wafer Surfaces and Layers in 2D with IR Technology


  • Brand
  • PVA TePla SPA

EBIS Wafer Backside Optical Inspection

Semi-automatic Wafer Backside Inspection System


  • Brand
  • PVA TePla SPA

MSO Multi Site Layout Optimizer

Wafer Probe Solution with MSO


  • Brand
  • PVA TePla SPA

PIA Probe Inspection Addon

A multi functional compact docking unit for existing probers


  • Brand
  • PVA TePla SPA

MVT30 Mounting Verification Tool