Product Brands

High Resolution 3D Surface Non-Contact Measurement Systems

Preciese 3D Scanners in Harsh Environment with up to 0.013mm accuracy

Scanning Acoustic Microscopy Analytical Systems

Wafer Inspection Systems

Reflow Simulator for Observation and Measurement

Desktop Scanning Electron Microscopes and EDS Systems

Real Time X-Ray and CT Inspection System

Electron Microscope Supplies

Full solution of Metallography, Metallurgical Testing, Microstructural Analysis

  • Brand
  • PVA TePla SPA

SPA Inker

Fast Physical Inking of Wafers with 100% Ink Dot Quality Control


  • Brand
  • PVA TePla SPA

Semi Automatic Wafer Inspection

Wafer Inspection System with Wafer Loader and Wafer Mapping Software


  • Brand
  • PVA TePla SPA

SPA Inspector IR Wafer Inspection

AOI of Wafer Surfaces and Layers in 2D with IR Technology


  • Brand
  • PVA TePla SPA

EBIS Wafer Backside Optical Inspection

Semi-automatic Wafer Backside Inspection System


  • Brand
  • PVA TePla SPA

MSO Multi Site Layout Optimizer

Wafer Probe Solution with MSO


  • Brand
  • PVA TePla SPA

PIA Probe Inspection Addon

A multi functional compact docking unit for existing probers


  • Brand
  • PVA TePla SPA

MVT30 Mounting Verification Tool