Product Brands
Accredited Calibration for Dimensional, Electrical and Temperature
Automation and Robotics
Automatic Optical Inspection (AOI)
Precision Machining in Semiconductor Advanced Packaging
Leader in Thermal and UV Light Process Equipment since 1966
High End 3D CT X-Ray
Laser Range Finder
Auto and Accurate Bond Tester
Microscopy Solution - More than Microscopy
Scanning Acoustic Microscopy Analytical Systems
Wafer Inspection Systems
Reflow Simulator for Observation and Measurement
High Resolution 3D Surface Non-Contact Measurement Systems
Reliable High Speed Test Handlers since 2011
Nikon XTV160 Xray
Microwave Plasma Decapsulation System
eviXscan 3D is a brand of high quality scanners based on structured light technology
Electron Microscope Supplies
Full solution of Metallography, Metallurgical Testing, Microstructural Analysis
Leader in Wafer AOI and Precision Grinding in Semiconductor Advanced Packaging
- Brand
- cyberTECHNOLOGIES
CT 100
Compact, high resolution non-contact profilometer up to 150 x 150mm scanning area
- Brand
- PVA TePla SPA
EBIS Wafer Backside Optical Inspection
Semi-automatic Wafer Backside Inspection System
- Brand
- PVA TePla SPA
Semi Automatic Wafer Inspection
Wafer Inspection System with Wafer Loader and Wafer Mapping Software
- Brand
- PVA TePla SPA
SPA Inspector IR Wafer Inspection
AOI of Wafer Surfaces and Layers in 2D with IR Technology
- Brand
- PVA TePla SPA
PIA Probe Inspection Addon
A multi functional compact docking unit for existing probers
