Product Brands

High Resolution 3D Surface Non-Contact Measurement Systems

Preciese 3D Scanners in Harsh Environment with up to 0.013mm accuracy

Scanning Acoustic Microscopy Analytical Systems

Wafer Inspection Systems

Reflow Simulator for Observation and Measurement

Desktop Scanning Electron Microscopes and EDS Systems

Real Time X-Ray and CT Inspection System

Electron Microscope Supplies

Full solution of Metallography, Metallurgical Testing, Microstructural Analysis

  • Brand
  • emsis

SEM Sample Holders

SEM Sample Holders


  • Brand
  • emsis

Sample Preparation

Sample Preparation for EM


  • Brand
  • emsis

Filaments and Cathodes

Electron Microscope Filaments & Cathodes


  • Brand
  • emsis

FIB Supplies

FIB Supplies


  • Brand
  • emsis

Calibration Standards and Samples

Calibration Standards and Samples


  • Brand
  • emsis

Adapters for Stubs and Stages

Adapters for Stubs and Stages


  • Brand
  • emsis

SEM Sample Stubs

SEM Sample Stubs