Product Brands

High Resolution 3D Surface Non-Contact Measurement Systems

Preciese 3D Scanners in Harsh Environment with up to 0.013mm accuracy

Scanning Acoustic Microscopy Analytical Systems

Wafer Inspection Systems

Reflow Simulator for Observation and Measurement

Desktop Scanning Electron Microscopes and EDS Systems

Captura Easy-to-use and cost-effective optical coordinate measuring machine (CMM)

Power Semiconductor Testers

Electron Microscope Supplies

Full solution of Metallography, Metallurgical Testing, Microstructural Analysis